Infineon IR HiRel’s radiation-tolerant IC portfolio includes the BDP1CG15NB-01, a plastic-packaged, single-channel low-side gate-driver IC for space power systems. The device provides 8 A sink-current capability, 20 ns propagation delay, a maximum 20 V supply, 8 V/7 V undervoltage-lockout thresholds, and protection against shoot-through. It is specified as tolerant to single-event effects and total ionizing dose up to 30 krad(Si), with JEDEC qualification and additional TID testing under ESCC 22900.
For a lunar settlement, the device could improve the fault tolerance of power-conditioning units, distribution units, satellite buses, payloads, and motor drives. Its 30 krad(Si) rating provides a defined radiation margin, but it does not by itself cover the full lunar environment: long-duration systems must account for cumulative dose, solar-proton events, secondary radiation, thermal cycling, vacuum, single-event transients, and degradation of surrounding components. Plastic packaging may reduce cost and simplify procurement, but requires independent validation for the Ark’s lifetime, shielding, and contamination requirements.
The Ark team should evaluate the BDP1CG15NB-01 or equivalent devices in a radiation-qualified power-conversion reference design, map its 30 krad(Si) limit against habitat locations and shielding thickness, and test complete assemblies rather than isolated ICs. Procurement plans should track JEDEC and ESCC qualification evidence, radiation-lot data, second-source availability, lifecycle status, and derating at the intended bus voltage, switching frequency, temperature, and mission duration.